DOI
10.1016/j.ress.2006.02.002
Abstract
In experiments where failure times are sparse, degradation analysis is useful for the analysis of failure time distributions in reliability studies. This research investigates the link between a practitioner's selected degradation model and the resulting lifetime model. Simple additive and multiplicative models with single random effects are featured. Results show that seemingly innocuous assumptions of the degradation path create surprising restrictions on the lifetime distribution. These constraints are described in terms of failure rate and distribution classes.
Document Type
Post-print Article
Publication Date
2007
Publisher Statement
Copyright © 2007 Elsevier Ltd.
DOI: 10.1016/j.ress.2006.02.002
The definitive version is available at: https://www.sciencedirect.com/science/article/pii/S0951832006000536
Full Citation:
Bae, Suk Joo, Way Kuo, and Paul H. Kvam. "Degradation Models and Implied Lifetime Distributions." Reliability Engineering & System Safety 92, no. 5 (2007): 601-608. doi:10.1016/j.ress.2006.02.002.
Recommended Citation
Bae, Suk Joo; Kuo, Way; and Kvam, Paul H., "Degradation Models and Implied Lifetime Distributions" (2007). Department of Math & Statistics Faculty Publications. 209.
https://scholarship.richmond.edu/mathcs-faculty-publications/209