DOI
10.1198/004017004000000464
Abstract
As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents a degradation model for highly reliable light displays, such as plasma display panels and vacuum fluorescent displays (VFDs). Standard degradation models fail to capture the burn-in characteristics of VFDs, when emitted light actually increases up to a certain point in time before it decreases (or degrades) continuously. Random coefficients are used to model this phenomenon in a nonlinear way, which allows for a nonmonotonic degradation path. In many situations, the relative efficiency of the lifetime estimate is improved over the standard estimators based on transformed linear models.
Document Type
Post-print Article
Publication Date
2004
Publisher Statement
Copyright © 2004 Taylor & Francis.
DOI: 10.1198/004017004000000464
The definitive version is available at: https://amstat.tandfonline.com/doi/abs/10.1198/004017004000000464#.Wv7ruUgvyUl
Full Citation:
Bae, Suk Joo, and Paul H. Kvam. "A Nonlinear Random-Coefficients Model for Degradation Testing." Technometrics 46, no. 4 (2004): 460-469. doi:10.1198/004017004000000464.
Recommended Citation
Bae, Suk Joo and Kvam, Paul H., "A Nonlinear Random Coefficients Model for Degradation Testing" (2004). Department of Math & Statistics Faculty Publications. 202.
https://scholarship.richmond.edu/mathcs-faculty-publications/202