In experiments where failure times are sparse, degradation analysis is useful for the analysis of failure time distributions in reliability studies. This research investigates the link between a practitioner's selected degradation model and the resulting lifetime model. Simple additive and multiplicative models with single random effects are featured. Results show that seemingly innocuous assumptions of the degradation path create surprising restrictions on the lifetime distribution. These constraints are described in terms of failure rate and distribution classes.
Copyright © 2007 Elsevier Ltd.
The definitive version is available at: https://www.sciencedirect.com/science/article/pii/S0951832006000536
Bae, Suk Joo, Way Kuo, and Paul H. Kvam. "Degradation Models and Implied Lifetime Distributions." Reliability Engineering & System Safety 92, no. 5 (2007): 601-608. doi:10.1016/j.ress.2006.02.002.
Bae, Suk Joo; Kuo, Way; and Kvam, Paul H., "Degradation Models and Implied Lifetime Distributions" (2007). Math and Computer Science Faculty Publications. 209.