As an alternative to traditional life testing, degradation tests can be effective in assessing product reliability when measurements of degradation leading to failure can be observed. This article presents a degradation model for highly reliable light displays, such as plasma display panels and vacuum fluorescent displays (VFDs). Standard degradation models fail to capture the burn-in characteristics of VFDs, when emitted light actually increases up to a certain point in time before it decreases (or degrades) continuously. Random coefficients are used to model this phenomenon in a nonlinear way, which allows for a nonmonotonic degradation path. In many situations, the relative efficiency of the lifetime estimate is improved over the standard estimators based on transformed linear models.

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Post-print Article

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Copyright © 2004 Taylor & Francis.

DOI: 10.1198/004017004000000464

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Bae, Suk Joo, and Paul H. Kvam. "A Nonlinear Random-Coefficients Model for Degradation Testing." Technometrics 46, no. 4 (2004): 460-469. doi:10.1198/004017004000000464.